According to precedence, MOSFET datasheets show output capacitance at a single measured voltage. While these values were good enough for relative comparison between products in the past, it is ...
A capacitor measured with a $100 handheld multi-meter can give a substantially different result than the same capacitor measured with a $10,000 LCR meter. That same capacitor measured with two ...
Leakage current has been a leading cause of device failure in DRAM design, starting with the 20nm technology node. Problems with leakage current in DRAM design can lead to reliability issues, even ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback