As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...

Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...

Download this article in PDF format. Next-generation systems, from industrial Internet of Things (IIoT), factory automation, defense electronics, and network infrastructure equipment to medical and ...